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Improving transmission reliability of low-power medium access control protocols using average diversity combining

Ghamari, M., Heravi, B.M., Roedig, U., Honary, B. and Pickering, C.A. (2012) Improving transmission reliability of low-power medium access control protocols using average diversity combining. IET Wireless Sensor Systems, 2 (4). pp. 377-384. ISSN 2043-6386

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To link to this item DOI: 10.1049/iet-wss.2012.0029

Abstract/Summary

Embedded computer systems equipped with wireless communication transceivers are nowadays used in a vast number of application scenarios. Energy consumption is important in many of these scenarios, as systems are battery operated and long maintenance-free operation is required. To achieve this goal, embedded systems employ low-power communication transceivers and protocols. However, currently used protocols cannot operate efficiently when communication channels are highly erroneous. In this study, we show how average diversity combining (ADC) can be used in state-of-the-art low-power communication protocols. This novel approach improves transmission reliability and in consequence energy consumption and transmission latency in the presence of erroneous channels. Using a testbed, we show that highly erroneous channels are indeed a common occurrence in situations, where low-power systems are used and we demonstrate that ADC improves low-power communication dramatically.

Item Type:Article
Refereed:Yes
Divisions:Faculty of Science
ID Code:37077
Uncontrolled Keywords:access protocols; embedded systems; low-power electronics; radio transceivers; telecommunication network reliability; transceivers; average diversity combining; communication channels; embedded computer systems; embedded systems; energy consumption; erroneous channels; long maintenance-free operation; low-power communication protocols; low-power communication transceivers; low-power medium access control protocols; low-power systems; transmission latency; transmission reliability improvement; wireless communication transceivers
Publisher:Institution of Engineering and Technology

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