Analysing the locational pattern of international corporate technological researchCantwell, J. and Komopolou, E. (2003) Analysing the locational pattern of international corporate technological research. In: Serapio, M. G. and Hayashi, T. (eds.) Internationalization of research and development and the emergence of global R&D networks. Research in International Business (8). Elsevier, London, pp. 41-83. ISBN 9780762310593 Full text not archived in this repository. It is advisable to refer to the publisher's version if you intend to cite from this work. See Guidance on citing.
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