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Analysing the locational pattern of international corporate technological research

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Cantwell, J. and Komopolou, E. (2003) Analysing the locational pattern of international corporate technological research. In: Serapio, M. G. and Hayashi, T. (eds.) Internationalization of research and development and the emergence of global R&D networks. Research in International Business (8). Elsevier, London, pp. 41-83. ISBN 9780762310593

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Item Type:Book or Report Section
Refereed:Yes
Divisions:Arts, Humanities and Social Science > School of Politics, Economics and International Relations > Economics
ID Code:21269
Publisher:Elsevier
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