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Confidence intervals for secondary parameters following a sequential test

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Whitehead, J., Todd, S. ORCID: https://orcid.org/0000-0002-9981-923X and Hall, W. J. (2000) Confidence intervals for secondary parameters following a sequential test. Journal of the Royal Statistical Society: Series B (Statistical Methodology), 62 (4). pp. 731-745. ISSN 1369-7412

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To link to this item DOI: 10.1111/1467-9868.00260


Item Type:Article
Refereed:Yes
Divisions:Science > School of Mathematical, Physical and Computational Sciences > Department of Mathematics and Statistics
Science > School of Mathematical, Physical and Computational Sciences > Department of Mathematics and Statistics > Applied Statistics
ID Code:63943
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