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Image restoration for a rectangular poor-pixels detector

Wen, P. C., Wang, X. J. and Wei, H. (2010) Image restoration for a rectangular poor-pixels detector. In: International Symposium on Precision Engineering Measurements and Instrumentation. SPIE Proceedings, 7544. SPIE Press, Bellingham, WA, p. 754436.

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To link to this item DOI: 10.1117/12.885301


This paper presents a unique two-stage image restoration framework especially for further application of a novel rectangular poor-pixels detector, which, with properties of miniature size, light weight and low power consumption, has great value in the micro vision system. To meet the demand of fast processing, only a few measured images shifted up to subpixel level are needed to join the fusion operation, fewer than those required in traditional approaches. By maximum likelihood estimation with a least squares method, a preliminary restored image is linearly interpolated. After noise removal via Canny operator based level set evolution, the final high-quality restored image is achieved. Experimental results demonstrate effectiveness of the proposed framework. It is a sensible step towards subsequent image understanding and object identification.

Item Type:Book or Report Section
Divisions:Faculty of Science > School of Mathematical, Physical and Computational Sciences > Department of Computer Science
ID Code:17377
Additional Information:The symposium was held in Hangzhou, China, 8-11 Aug 2010.
Publisher:SPIE Press

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