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Extraction of Tschebysheff design data for the low pass dielectric multilayer

Seeley, J.S., Liddell, H.M. and Chen, T.C. (1973) Extraction of Tschebysheff design data for the low pass dielectric multilayer. Journal of Modern Optics, 20 (8). pp. 641-661. ISSN 1362-3044

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To link to this article DOI: 10.1080/713818809

Abstract/Summary

The extraction of design data for the lowpass dielectric multilayer according to Tschebysheff performance is described. The extraction proceeds initially by analogy with electric-circuit design, and can then be given numerical refinement which is also described. Agreement with the Tschebysheff desideratum is satisfactory. The multilayers extracted by this procedure are of fractional thickness, symmetric with regard to their central layers.

Item Type:Article
Refereed:Yes
Divisions:Faculty of Science > School of Systems Engineering
ID Code:17933
Publisher:Taylor & Francis

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