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Subspace-based blind adaptive multiuser detection for multirate DS/CDMA signals

Huang, L., Zheng, F.-C. and Faulkner, M. (2001) Subspace-based blind adaptive multiuser detection for multirate DS/CDMA signals. In: 11th IEEE Signal Processing Workshop on Statistical Signal Processing 2001, 6-8 Aug 2001, Singapore, pp. 106-109.

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To link to this article DOI: 10.1109/SSP.2001.955233

Abstract/Summary

The existing dual-rate blind linear detectors, which operate at either the low-rate (LR) or the high-rate (HR) mode, are not strictly blind at the HR mode and lack theoretical analysis. This paper proposes the subspace-based LR and HR blind linear detectors, i.e., bad decorrelating detectors (BDD) and blind MMSE detectors (BMMSED), for synchronous DS/CDMA systems. To detect an LR data bit at the HR mode, an effective weighting strategy is proposed. The theoretical analyses on the performance of the proposed detectors are carried out. It has been proved that the bit-error-rate of the LR-BDD is superior to that of the HR-BDD and the near-far resistance of the LR blind linear detectors outperforms that of its HR counterparts. The extension to asynchronous systems is also described. Simulation results show that the adaptive dual-rate BMMSED outperform the corresponding non-blind dual-rate decorrelators proposed by Saquib, Yates and Mandayam (see Wireless Personal Communications, vol. 9, p.197-216, 1998).

Item Type:Conference or Workshop Item (Paper)
Refereed:Yes
Divisions:Faculty of Science > School of Systems Engineering
ID Code:18769
Uncontrolled Keywords:3rd-generation wireless communications systems, BER, adaptive dual-rate blind MMSE detectors, bit error rate, blind decorrelating detectors, dual-rate blind linear detectors, high-rate mode, low-rate data bit detection, low-rate mode, multirate DS/CDMA signals, near-far resistance, nonblind dual-rate decorrelators, simulation results, subspace-based blind adaptive multiuser detection, subspace-based blind linear detectors, synchronous DS/CDMA systems, weighting strategy
Additional Information:Proceedings ISBN: 0780370112
Publisher:IEEE Press

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