Detection of faults in a high speed packaging machine using a multilayer perceptron (MLP)
Clark, J. Y. and Warwick, K. (1995) Detection of faults in a high speed packaging machine using a multilayer perceptron (MLP). In: IEE Colloquium on Innovations in Manufacturing Control Through Mechatronics, 22 November 1995, Newport, UK, 7/1-7/3.
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To link to this item DOI: 10.1049/ic:19951360
In high speed manufacturing systems, continuous operation is desirable, with minimal disruption for repairs and service. An intelligent diagnostic monitoring system, designed to detect developing faults before catastrophic failure, or prior to undesirable reduction in output quality, is a good means of achieving this. Artificial neural networks have already been found to be of value in fault diagnosis of machinery. The aim here is to provide a system capable of detecting a number of faults, in order that maintenance can be scheduled in advance of sudden failure, and to reduce the necessity to replace parts at intervals based on mean time between failures. Instead, parts will need to be replaced only when necessary. Analysis of control information in the form of position error data from two servomotors is described.