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A narrow band pulsed eddy current instrument for materials testing

Boness, K. D., Holt, C.C. and Holt, R.P., (1984) A narrow band pulsed eddy current instrument for materials testing. Technical Report. NASA STI/Recon

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Abstract/Summary

The principles of operation of an experimental prototype instrument known as J-SCAN are described along with the derivation of formulae for the rapid calculation of normalized impedances; the structure of the instrument; relevant probe design parameters; digital quantization errors; and approaches for the optimization of single frequency operation. An eddy current probe is used As the inductance element of a passive tuned-circuit which is repeatedly excited with short impulses. Each impulse excites an oscillation which is subject to decay dependent upon the values of the tuned-circuit components: resistance, inductance and capacitance. Changing conditions under the probe that affect the resistance and inductance of this circuit will thus be detected through changes in the transient response. These changes in transient response, oscillation frequency and rate of decay, are digitized, and then normalized values for probe resistance and inductance changes are calculated immediately in a micro processor. This approach coupled with a minimum analogue processing and maximum of digital processing has advantages compared with the conventional approaches to eddy current instruments. In particular there are: the absence of an out of balance condition and the flexibility and stability of digital data processing.

Item Type:Report (Technical Report)
Divisions:Faculty of Science > School of Systems Engineering
ID Code:6071
Publisher:NASA STI/Recon

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