Extraction of Tschebysheff design data for the low pass dielectric multilayerSeeley, J.S., Liddell, H.M. and Chen, T.C. (1973) Extraction of Tschebysheff design data for the low pass dielectric multilayer. Journal of Modern Optics, 20 (8). pp. 641-661. ISSN 1362-3044 Full text not archived in this repository. It is advisable to refer to the publisher's version if you intend to cite from this work. See Guidance on citing. To link to this item DOI: 10.1080/713818809 Abstract/SummaryThe extraction of design data for the lowpass dielectric multilayer according to Tschebysheff performance is described. The extraction proceeds initially by analogy with electric-circuit design, and can then be given numerical refinement which is also described. Agreement with the Tschebysheff desideratum is satisfactory. The multilayers extracted by this procedure are of fractional thickness, symmetric with regard to their central layers.
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