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Fault Tolerant Integrated Memory Design

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Njinda, C. A., Guy, C. and Moore, W. R. (1988) Fault Tolerant Integrated Memory Design. In: IEEE Computer Society Workshop on Defect and Fault Tolerance in VLSI Systems, October 1988, Springfield, Massachusetts, 6.4.1-6.4.11.

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Item Type:Conference or Workshop Item (Paper)
Refereed:Yes
Divisions:Science
ID Code:27749
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