Energy separation of neutrons scattered at small angles from silicon using time-of-flight techniquesCheung, J. Y., Stewart, R. J. and May, R. P. (2006) Energy separation of neutrons scattered at small angles from silicon using time-of-flight techniques. Journal of Applied Crystallography, 39. pp. 46-52. ISSN 0021-8898 Full text not archived in this repository. It is advisable to refer to the publisher's version if you intend to cite from this work. See Guidance on citing. Abstract/SummaryThe time-of-flight technique is used on a small-angle neutron scattering instrument to separate the energies of the scattered neutrons, in order to determine the origin of the temperature-dependent scattering observed from silicon at Q > similar to 0.1 angstrom(-1). A quantitative analysis of the results in comparison with the phonon dispersion curves, determined by Dolling using a triple-axis neutron spectrometer, shows that the temperature-dependent scattering can be understood in terms of Umklapp processes whereby neutrons gain energy from phonons.
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