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Preventing carbon contamination of optical devices for X-rays: the effect of oxygen on photon-induced dissociation of CO on platinum

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Risterucci, P., Held, G., Bendounan, A., Silly, M. G., Chauvet, C., Pierucci, D., Beaulieu, N. and Sirotti, F. (2012) Preventing carbon contamination of optical devices for X-rays: the effect of oxygen on photon-induced dissociation of CO on platinum. Journal of Synchrotron Radiation, 19 (4). pp. 570-573. ISSN 0909-0495

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To link to this article DOI: 10.1107/S090904951202050X

Abstract/Summary

Platinum is one of the most common coatings used to optimize mirror reflectivity in soft X-ray beamlines. Normal operation results in optics contamination by carbon-based molecules present in the residual vacuum of the beamlines. The reflectivity reduction induced by a carbon layer at the mirror surface is a major problem in synchrotron radiation sources. A time-dependent photoelectron spectroscopy study of the chemical reactions which take place at the Pt(111) surface under operating conditions is presented. It is shown that the carbon contamination layer growth can be stopped and reversed by low partial pressures of oxygen for optics operated in intense photon beams at liquidnitrogen temperature. For mirrors operated at room temperature the carbon contamination observed for equivalent partial pressures of CO is reduced and the effects of oxygen are observed on a long time scale.

Item Type:Article
Refereed:Yes
Divisions:Interdisciplinary centres and themes > Chemical Analysis Facility (CAF)
Faculty of Life Sciences > School of Chemistry, Food and Pharmacy > Department of Chemistry
ID Code:28844
Uncontrolled Keywords:carbon contamination;beamline optics;surface chemistry;photoelectron spectroscopy
Publisher:International Union of Crystallography

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