Characterisation of amorphous and nanocrystalline molecular materials by total scatteringBillinge, S. , Dykhne, T., Juhas, P., Bozin, E., Taylor, R., Florence, A. and Shankland, K. (2010) Characterisation of amorphous and nanocrystalline molecular materials by total scattering. Crystengcomm, 12 (5). pp. 1366-1368. ISSN 1466-8033 Full text not archived in this repository. It is advisable to refer to the publisher's version if you intend to cite from this work. See Guidance on citing. To link to this item DOI: 10.1039/b915453a Abstract/SummaryThe use of high-energy X-ray total scattering coupled with pair distribution function analysis produces unique structural fingerprints from amorphous and nanostructured phases of the pharmaceuticals carbamazepine and indomethacin. The advantages of such facility-based experiments over laboratory-based ones are discussed and the technique is illustrated with the characterisation of a melt-quenched sample of carbamazepine as a nanocrystalline (4.5 nm domain diameter) version of form III.
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