Characterisation of amorphous and nanocrystalline molecular materials by total scattering
Billinge, S. , Dykhne, T., Juhas, P., Bozin, E., Taylor, R., Florence, A. and Shankland, K. (2010) Characterisation of amorphous and nanocrystalline molecular materials by total scattering. Crystengcomm, 12 (5). pp. 1366-1368. ISSN 1466-8033
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To link to this item DOI: 10.1039/b915453a
The use of high-energy X-ray total scattering coupled with pair distribution function analysis produces unique structural fingerprints from amorphous and nanostructured phases of the pharmaceuticals carbamazepine and indomethacin. The advantages of such facility-based experiments over laboratory-based ones are discussed and the technique is illustrated with the characterisation of a melt-quenched sample of carbamazepine as a nanocrystalline (4.5 nm domain diameter) version of form III.