A physics investigation on impedance matching theory in microwave absorption film—Part I. TheoryLiu, Y. ORCID: https://orcid.org/0000-0001-9862-5786, Drew, M. G. B. ORCID: https://orcid.org/0000-0001-8687-3440 and Liu, Y. ORCID: https://orcid.org/0000-0001-5924-9730 (2023) A physics investigation on impedance matching theory in microwave absorption film—Part I. Theory. Journal of Applied Physics, 134 (4). 045303. ISSN 1089-7550 Full text not archived in this repository. It is advisable to refer to the publisher's version if you intend to cite from this work. See Guidance on citing. To link to this item DOI: 10.1063/5.0153608 Abstract/SummaryThe mechanism for microwave absorption in a film has previously been numerically verified from the theoretical formula for RL and attributed to angular and amplitude effects with a simple geometrical representation from energy conservation unique to the film. Starting from the case where |RL| = 0, using basic transmission-line theory and mathematics, it is confirmed theoretically here that the mechanism for absorption mechanism in a film, responsible for the minima of the reflection loss RL/dB, is best explained by wave cancelation theory rather than by impedance matching theory. This theoretical proof also reveals that the mechanisms for a film and material are different. The flaws of neglecting the phase effects of interfaces in a film in quarter-wavelength theory are also quantitatively discussed from transmission-line theory. Contrary to the theory held currently, the reported minima of RL/dB originate from phase effects in the film rather than from the resonance peaks for the intrinsic frequencies of a material.
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