Phase separation in thin films of end-grafted block copolymersO'Driscoll, B. M. D., Oren, R. and Hamley, I. W. ORCID: https://orcid.org/0000-0002-4549-0926 (2011) Phase separation in thin films of end-grafted block copolymers. Polymers for Advanced Technologies, 22 (6). pp. 924-932. ISSN 1042-7147 Full text not archived in this repository. It is advisable to refer to the publisher's version if you intend to cite from this work. See Guidance on citing. To link to this item DOI: 10.1002/pat.1597 Abstract/SummaryAn atomic force microscopy investigation was carried out on various thick (30–120 nm) polymethyl methacrylate-bpolystyrene and poly(2-(dimethyl amino)ethyl methacrylate)-b-polystyrene films prepared via a grafting-from method. The structure of the films was examined with both topographic and phase imaging. Several different morphologies were observed including a perforated lamellar phase with irregular perforations. In addition, complementary small-angle X-ray scattering and reflectometry results measurements on a non-grafted polymer are presented.
Altmetric Deposit Details University Staff: Request a correction | Centaur Editors: Update this record |