Quantitative aAdsorbate structure determination for quasicrystals using X-Ray standing wavesDiehl, R. D., Li, H. I., Su, S. Y., Mayer, A., Stanisha, N. A., Ledieu, J., Lovelock, K. R. J., Jones, R. G., Deyko, A., Wearing, L. H., McGrath, R., Chaudhuri, A. and Woodruff, D. P. (2014) Quantitative aAdsorbate structure determination for quasicrystals using X-Ray standing waves. Physical Review Letters, 113 (10). 106101. ISSN 0031-9007 Full text not archived in this repository. It is advisable to refer to the publisher's version if you intend to cite from this work. See Guidance on citing. To link to this item DOI: 10.1103/PhysRevLett.113.106101 Abstract/SummaryThe quantitative structure determination of adsorbed species on quasicrystal surfaces has so far appeared to present insurmountable problems. The normal incidence standing x-ray wave field technique offers a simple solution, without extensive data sets or large computations. Its application to quasicrystals raises several conceptual difficulties that are related to the phase problem in x-ray diffraction. We demonstrate their solution for the case of Si atoms adsorbed on the decagonal Co-rich modification of the Al-Co-Ni quasicrystal to determine the local structure, comprising 6-atom clusters in particular hollow sites.
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