Dielectric properties of process cheese from 0.3 to 3 Ghz
Everard, C., Fagan, C., O'Donnell, C., O'Callaghan, D. and Lyng, J. (2006) Dielectric properties of process cheese from 0.3 to 3 Ghz. Journal of Food Engineering, 75 (3). pp. 415-422. ISSN 0260-8774
Full text not archived in this repository.
To link to this article DOI: 10.1016/j.jfoodeng.2005.04.027
Dielectric properties of 16 process cheeses were determined over the frequency range 0.3-3 GHz. The effect of temperature on the dielectric properties of process cheeses were investigated at temperature intervals of 10 degrees C between 5 and 85 degrees C. Results showed that the dielectric constant decreased gradually as frequency increased, for all cheeses. The dielectric loss factor (epsilon") decreased from above 125 to below 12 as frequency increased. epsilon' was highest at 5 degrees C and generally decreased up to a temperature between 55 and 75 degrees C. epsilon" generally increased with increasing temperature for high and medium moisture/fat ratio cheeses. epsilon" decreased with temperature between 5 and 55 degrees C and then increased, for low moisture/fat ratio cheese. Partial least square regression models indicated that epsilon' and epsilon" could be used as a quality control screening application to measure moisture content and inorganic salt content of process cheese, respectively. (c) 2005 Elsevier Ltd. All rights reserved..
Repository Staff Only: item control page