Surface imaging of thermally sensitive particulate and fibrous materials with the atomic force microscope: a novel sample preparation methodBaldwin, P.M., Frazier, R., Adler, J., Glasbey, T.O., Keane, M.P., Roberts, C.J., Tendler, S.J.B., Davies, M.C. and Melia, C.D. (1996) Surface imaging of thermally sensitive particulate and fibrous materials with the atomic force microscope: a novel sample preparation method. Journal of Microscopy, 184 (2). pp. 75-80. ISSN 1365-2818 Full text not archived in this repository. It is advisable to refer to the publisher's version if you intend to cite from this work. See Guidance on citing. To link to this item DOI: 10.1111/j.1365-2818.1996.tb00001.x
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