Surface imaging of thermally sensitive particulate and fibrous materials with the atomic force microscope: a novel sample preparation methodTools  Baldwin, P.M., Frazier, R., Adler, J., Glasbey, T.O., Keane, M.P., Roberts, C.J., Tendler, S.J.B., Davies, M.C. and Melia, C.D. (1996) Surface imaging of thermally sensitive particulate and fibrous materials with the atomic force microscope: a novel sample preparation method. Journal of Microscopy, 184 (2). pp. 75-80. ISSN 1365-2818 Full text not archived in this repository. To link to this article DOI: 10.1111/j.1365-2818.1996.tb00001.x
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