High-resolution atomic force microscopy of dextran monolayer hydrationFrazier, R. ORCID: https://orcid.org/0000-0003-4313-0019, Davies, M. C., Matthijs, G., Roberts, C. J., Schacht, E., Tendler, S. J. B. and Williams, P. M. (1997) High-resolution atomic force microscopy of dextran monolayer hydration. Langmuir, 13 (18). pp. 4795-4798. ISSN 0743-7463 Full text not archived in this repository. It is advisable to refer to the publisher's version if you intend to cite from this work. See Guidance on citing. To link to this item DOI: 10.1021/la970288e
Altmetric Deposit Details University Staff: Request a correction | Centaur Editors: Update this record |