Surface imaging of thermally sensitive particulate and fibrous materials with the atomic force microscope: a novel sample preparation method
Baldwin, P.M., Frazier, R. Full text not archived in this repository. It is advisable to refer to the publisher's version if you intend to cite from this work. See Guidance on citing. To link to this item DOI: 10.1111/j.1365-2818.1996.tb00001.x
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